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X‐ray fluorescence analysis of samples with elemental sulphur. Effect of sulphur sublimation
Author(s) -
Chinchón J. S.,
LópezSoler A.,
Travería A.,
Vaquer R.
Publication year - 1988
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300170604
Subject(s) - sublimation (psychology) , sulfur , elemental analysis , chemistry , analytical chemistry (journal) , fluorescence , x ray fluorescence , inorganic chemistry , environmental chemistry , optics , physics , psychology , organic chemistry , psychotherapist
The precautions to be taken during x‐ray fluorescence (XRF) analysis of samples containing elemental sulphur were investigated. Elemental sulphur under vacuum (vacuum required for S Kα analysis) undergoes sublimation. As a result, the sulphur intensity signal diminishes in direct relation to the time during which the sample has been under vacuum. The work power accelerates the sublimation of sulphur. A method for obtaining real analytical values is proposed. The risk to the XRF spectrometer constituted due to sublimed sulphur are pointed out.