X‐ray fluorescence analysis of samples with elemental sulphur. Effect of sulphur sublimation | Zendy

Chinchón J. S. | Zendy; LópezSoler A. | Zendy; Travería A. | Zendy; Vaquer R. | Zendy

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X‐ray fluorescence analysis of samples with elemental sulphur. Effect of sulphur sublimation

Author(s) -

Chinchón J. S.,

LópezSoler A.,

Travería A.,

Vaquer R.

Publication year - 1988

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300170604

Subject(s) - sublimation (psychology) , sulfur , elemental analysis , chemistry , analytical chemistry (journal) , fluorescence , x ray fluorescence , inorganic chemistry , environmental chemistry , optics , physics , psychology , organic chemistry , psychotherapist

The precautions to be taken during x‐ray fluorescence (XRF) analysis of samples containing elemental sulphur were investigated. Elemental sulphur under vacuum (vacuum required for S Kα analysis) undergoes sublimation. As a result, the sulphur intensity signal diminishes in direct relation to the time during which the sample has been under vacuum. The work power accelerates the sublimation of sulphur. A method for obtaining real analytical values is proposed. The risk to the XRF spectrometer constituted due to sublimed sulphur are pointed out.

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