Precise calibration of sequential x‐ray spectrometers | Zendy

Sperling Z. | Zendy

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Precise calibration of sequential x‐ray spectrometers

Author(s) -

Sperling Z.

Publication year - 1988

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300170408

Subject(s) - spectrometer , calibration , offset (computer science) , x ray , optics , computational physics , physics , analytical chemistry (journal) , computer science , chemistry , chromatography , quantum mechanics , programming language

Small differences between actual 2 d spacings of analytical crystals and those used for the calculation of 2θ tables generate θ‐dependent deviations of measured 2θ values from tabulated values of up to several tenths of a degree. It is shown that these deviations can be separated into a constant and a tan θ‐proportional component and used for a precise calibration of the spectrometer in terms of the actual value of the 2 d spacing of the analytical crystal and of the 2θ dial offset. The reported results were obtained on two instruments, an older manual spectrometer and a newer one operating under computer control.

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