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A general way of solving matrix effect problems in elemental analysis by EDXRFS
Author(s) -
Orlic I.,
Makjanie J.,
Raos D.,
Valkovic V.
Publication year - 1988
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300170405
Subject(s) - formalism (music) , matrix (chemical analysis) , rayleigh scattering , excitation , computer science , set (abstract data type) , range (aeronautics) , standard addition , algorithm , simple (philosophy) , computational physics , analytical chemistry (journal) , mathematics , chemistry , materials science , physics , optics , statistics , detection limit , quantum mechanics , chromatography , visual arts , programming language , art , musical , composite material , philosophy , epistemology
Instead of using the complete set of fundamental parameters for solving matrix effects in quantitative energy‐dispersive x‐ray fluorescence (EDXRF) analysis, some of them, such as excitation and detection efficiency and the dependence of Compton and Rayleigh scattered intensities on sample composition, were determined from a set of standards such as chemical compounds and pure elements. In this way all fundamental parameters except mass absorption coefficients were removed from the calculation procedure, which results in a much simpler formalism. The computer program COREX based on this principle and described in this paper is relatively simple and can run even on small microcomputers, while the overall error can be kept in the range of a few percent if the calibration procedure and sample preparation were performed carefully.