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Physical aspects of microscopic characterization of materials ( Scanning Microscopy supplement 1, 1987). Proceedings of the 5th pfefferkorn conference held in Brueggen, West Germany, 2‐7 October 1986. Edited by J. Kirschner, K. Murata and J. A. Venables 253 pages. ISSN 0892‐953x. Published by Scanning Microscopy International, P.O. Box 66507, AMF O'Hare (Chicago), Illinois 60666, U.S.A.
Author(s) -
Gilfrich John
Publication year - 1988
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300170309
Subject(s) - characterization (materials science) , engineering physics , materials science , nanotechnology , engineering