Premium
Absolute method for determination of metallic film thickness by X‐ray fluorescence
Author(s) -
Vázquez C.,
de Leyt D. V.,
Riveros J. A.
Publication year - 1988
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300170203
Subject(s) - gravimetric analysis , nickel , analytical chemistry (journal) , materials science , substrate (aquarium) , fluorescence , absorption (acoustics) , deposition (geology) , metal , wavelength , x ray fluorescence , mass attenuation coefficient , attenuation coefficient , optics , chemistry , metallurgy , composite material , optoelectronics , chromatography , organic chemistry , sediment , paleontology , oceanography , physics , biology , geology
An absolute method for the determination of the thickness of a nickel film on iron has been developed. The mass absorption coefficient of nickel for the effective wavelength has been determined empirically and mathematically. The found values were in agreement. To perform this method only one intensity measurement of the fluorescent substrate emission is required (Fe Kα). The method was tested using iron sheets with different thicknesses of nickel obtained by chemical deposition. Thicknesses between 6 and 25 μm produced relative differences from gravimetric values of 1.8‐1.1%.