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Assessment of the gaussian ϕ(ρ z ) curves in quantitative electron probe microanalysis without optimization of the parameters
Author(s) -
Saá J. H. Tirira,
Del Giorgio M. A.,
Riveros J. A.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160604
Subject(s) - asymmetry , gaussian , standard deviation , electron probe microanalysis , microanalysis , relative standard deviation , value (mathematics) , absolute deviation , mean value , analytical chemistry (journal) , mathematics , physics , chemistry , statistics , optics , quantum mechanics , scanning electron microscope , chromatography , detection limit , organic chemistry
Abstract A new expression for the parameter β of the ϕ(ρ z ) curves is developed and the calculated K intensity ratios are compared with the corresponding experimental K , compiled in previous publications. The results show a mean value for K / K of 1.003, a standard deviation of 4.8% and an asymmetry of 1.01 with respect to unity.