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Ice thickness and low‐energy Si(Li) detector efficiency measurements
Author(s) -
Cohen David D.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160603
Subject(s) - detector , materials science , range (aeronautics) , low energy , optics , analytical chemistry (journal) , physics , atomic physics , chemistry , composite material , chromatography
A simple technique for measuring the thickness of ice build‐up on the front face of Si(Li) detectors is described. This ice thickness varies with time and significantly modifies the low‐energy efficiency of Si(Li) detectors in the 1–5 keV energy range. We also report on the branching ratios for the ten resolvable neptunium M shell X‐ray lines from thin 241 Am α sources.