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Elemental analysis using electron beam‐induced K X‐rays
Author(s) -
Pape A.,
Sens J. C.,
Georgiadis A.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160505
Subject(s) - bremsstrahlung , electron , excitation , atomic physics , cathode ray , range (aeronautics) , physics , beam (structure) , resolution (logic) , excitation function , detector , optics , nuclear physics , materials science , nuclear reaction , quantum mechanics , artificial intelligence , computer science , composite material
Abstract Representative production cross‐sections for bremsstrahlung, which constitutes an unavoidable spectral background in an X‐ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2—10 MeV. These values, used in conjunction with the corresponding K X‐ray production cross‐sections and non‐fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K X‐ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit.