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Description of low‐energy peak distortion observed in X‐ray spectrometry with Si(Li) detectors
Author(s) -
Heckel J.,
Scholz W.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160409
Subject(s) - detector , deconvolution , distortion (music) , energy (signal processing) , x ray detector , channel (broadcasting) , mass spectrometry , spectral line , optics , physics , materials science , analytical chemistry (journal) , computational physics , chemistry , optoelectronics , computer science , telecommunications , amplifier , astronomy , cmos , chromatography , quantum mechanics
A simple model is developed to describe the shape and intensity of the low‐energy peak distortion measured with Si(Li) detectors in X‐RAY SPECTROMETRY. Based on this model, a method is outlined for correcting the distortion channel by channel, which drastically reduces the expense of the deconvolution of the pulse‐height spectra measured in energy‐dispersive X‐ray emission analysis with Si(Li) detectors.