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Energy‐dispersive X‐ray fluorescence analysis of massive sulfides using fundamental influence coefficients
Author(s) -
Johnson Robert G.,
Fleming Stanley L.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160406
Subject(s) - x ray fluorescence , sulfide , analytical chemistry (journal) , fluorescence , matrix (chemical analysis) , materials science , energy (signal processing) , chemistry , physics , metallurgy , environmental chemistry , optics , composite material , quantum mechanics
A method for the energy‐dispersive X‐ray fluorescence analysis of Si, S, Fe, Cu, Zn, Pb, Ag, Cd and Sn in massive sulfide samples is described. Samples were prepared as briquettes, and a matrix correction employing inter‐element influence coefficients calculated from fundamental parameters was used. Values calculated in this manner for six international reference materials compare favorably with those found in the literature as well as those determined with other methods.