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Routine method of X‐ray spectrometric analysis without standards involving only initial instrumental calibration. 1—Theory and derivation of calculation equations
Author(s) -
Wang Yongzhong,
Chen Zhimin
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160308
Subject(s) - instrumentation (computer programming) , calibration , set (abstract data type) , attenuation , x ray fluorescence , element (criminal law) , series (stratigraphy) , mathematical analysis , fluorescence , analytical chemistry (journal) , chemistry , mathematics , physics , optics , computer science , chromatography , statistics , programming language , operating system , paleontology , law , political science , biology
Using theoretical expressions derived previously, a set of equations for the calculation of characteristic X‐ray fluorescence spectrometric parameters without standards is derived. All effects due to K series spectra of the j th element which can excite the characteristic fluorescent X‐ray of the i th element and all effects due to the instrumentation have been considered. An equation for the calculation of the attenuation factor of the instrument is presented. The results of experiments show that the accuracy of the equations is good, and in their practical application the geometric configuration of the specimen is generally not required. The specimen can be a fragment, piece or powder, etc., without special preparation requirements.