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SEM studies on silica from plant materials
Author(s) -
Prasanna P.,
Patel M.
Publication year - 1987
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300160204
Subject(s) - husk , scanning electron microscope , straw , rice straw , leaching (pedology) , materials science , chemical engineering , mineralogy , composite material , chemistry , botany , environmental science , agronomy , engineering , biology , soil science , soil water
The Silica structural framework in plant materials can be separated from the organic part by acid leaching and can be examined by SEM. Scanning electron micrographs characterizing the bonding and distribution patterns of silica in rice husk, rice straw and sugarcane leaves are presented. The differences in the surface morphology of the three plant products are discussed.