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Calculation of relative x‐ray fluorescence intensity for annular‐source geometry by the Monte Carlo method
Author(s) -
Tang S. M.,
Kump P.,
Yap C. T.,
Bilal M. G.
Publication year - 1986
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300150412
Subject(s) - monte carlo method , intensity (physics) , x ray fluorescence , excitation , x ray , fluorescence , geometry , materials science , physics , optics , atomic physics , computational physics , mathematics , statistics , quantum mechanics
The calculation of relative x‐ray fluorescence intensity for annular‐source geometry by the Monte Carlo method is reported. The K x‐ray fluorescence intensities for different specimen positions were measured and found to be in excellent agreement with the calculated values. The same method was used to obtain the distribution of excitation intensity across the specimen surface. The usefulness of the results of such a calculation is discussed.