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Study of the Kα emission spectrum of copper
Author(s) -
Berger H.
Publication year - 1986
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300150405
Subject(s) - diffraction , spectrum (functional analysis) , copper , distortion (music) , dispersion (optics) , line (geometry) , intensity (physics) , emission spectrum , optics , physics , materials science , spectral line , computational physics , geometry , mathematics , quantum mechanics , optoelectronics , amplifier , cmos , metallurgy
A simple model of the x‐ray Kα emission spectrum of copper metal has been proved to fit the experimental distribution curve of diffracted intensity fairly well, after correcting for profile distortion due to the spectrometer geometry and the diffraction process. Each Kα line can be described by a doublet of overlapping dispersion curves of different height and width. Although the physical relevance of the model is not clear at present, the simple analytical expression of the spectrum may be useful for some problems in x‐ray diffractometry.