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Monte Carlo simulation of backscattered peaks in secondary target energy‐dispersive x‐ray spectra
Author(s) -
Van Dyck Peter,
Török Szabina,
Van Grieken René
Publication year - 1986
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300150403
Subject(s) - monte carlo method , incoherent scatter , photon , physics , x ray tube , coherent backscattering , spectral line , optics , atomic number , detector , computational physics , compton scattering , photon energy , scattering , intensity (physics) , energy (signal processing) , x ray , atomic physics , anode , electrode , statistics , mathematics , quantum mechanics , astronomy
Abstract A Monte Carlo simulation has been developed to describe the incoherent and coherent scatter processes for the complex geometry of a secondary target energy‐dispersive x‐ray fluorescence system. Photons are followed from the x‐ray tube anode until the detection of scattered secondary target photons in the active Si layer of the detector. The program quantitatively shows the broadening of the incoherent scatter peak with increasing atomic number, and it models the incoherent peak shape adequately. The incoherent‐to‐coherent scatter intensity ratios obtained differ by 10–30% from the theoretical values, while their dependence on the sample atomic number corresponds to that expected from theory.