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The self‐absorption correction in PIXE microanalysis
Author(s) -
Dyson N. A.,
Fakhouri Haifa
Publication year - 1986
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300150310
Subject(s) - microanalysis , absorption (acoustics) , proton , tracer , analytical chemistry (journal) , electron probe microanalysis , materials science , chemistry , optics , nuclear physics , physics , mineralogy , electron microprobe , environmental chemistry , organic chemistry
The self‐absorption effect for characteristic x‐rays produced by proton bombardment of thick targets has been studied experimentally by the ‘tracer‐layer’ and ‘angular distribution’ techniques. Four proton energies have been used. The experimental data have been converted into f(χ) curves which can be used to apply a self‐absorption correction in PIXE microanalysis.