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Energy dependence of the, sensitivity of sequential x‐ray spectrometers obtained from multi‐element standards
Author(s) -
Freiburg C.,
Reichert W.,
Solomah A. G.
Publication year - 1986
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300150303
Subject(s) - spectrometer , sensitivity (control systems) , analytical chemistry (journal) , matrix (chemical analysis) , analyte , pellets , offset (computer science) , materials science , x ray , optics , chemistry , physics , chromatography , electronic engineering , computer science , composite material , programming language , engineering
The sensitivity of an x‐ray spectrometer as a function of the x‐ray energy is defined as S = I/c = f(E) , where S is the sensitivity, I is the count rate per second, c is the concentration and E is the x‐ray energy of the analyte line. Knowledge of its exact shape is needed to calibrate the spectrometer and to analyse minute amounts in different matrices. It can be determined experimentally using multi‐element standards with low concentrations of the standard element, with careful selection of the standard and the matrix compounds. The homogeneous mixtures of powder pellets were obtained by ball‐milling with the addition of lubricating agents. The grain sizes were controlled under a light microscope. Two empirical equations describing the sensitivity are proposed:where S is the sensitivity, A , B 1 , D and F are numerical coefficients, θ is the Bragg angle of the analysing crystal, E 0 is the energy of maximum sensitivity ( E 0 = 17.6 kV) and the exponent p is equal to 0.5. The ranges of validity of Eqns (1) and (2) are discussed for a PW 1410 (Cr side‐window tube) and an S/MAX (Rh front‐window tube) spectrometer. An application using Eqn (1) is given for the determination of the element concentrations from Nb to Ni in certified soil standards.