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The problem of irradiation and detection angles in quantitative XRF analysis
Author(s) -
Avaldi L.,
Bui C.,
Milazzo M.
Publication year - 1985
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300140405
Subject(s) - irradiation , sample (material) , materials science , matrix (chemical analysis) , yield (engineering) , simple (philosophy) , analytical chemistry (journal) , chemistry , composite material , physics , chromatography , nuclear physics , philosophy , epistemology
The problem of the dependence of the XRF yield on the irradiation and detection angles and on the sample volume has been critically reviewed. A simple procedure, which accounts for the effect of the sample finite thickness, is given. Applications to the analysis of metal alloys and of organic matrix standards are also reported.
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