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Least‐squares fits of fundamental parameters for quantitative x‐ray analysis as a function of Z (11 ≤ Z ≤ 83) and E (1 keV ≤ E ≤ 50 keV)
Author(s) -
Poehn Christian,
Wernisch Johann,
Hanke Wolfgang
Publication year - 1985
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300140305
Subject(s) - absorption edge , atomic physics , mass attenuation coefficient , function (biology) , physics , electron microprobe , energy (signal processing) , atomic mass , analytical chemistry (journal) , attenuation coefficient , chemistry , optics , condensed matter physics , mineralogy , quantum mechanics , evolutionary biology , band gap , biology , chromatography
A presentation by useful approximations of fundamental parameters needed for XRF and EPMA is given. The set of fundamental parameters include: critical energy or edge energy, energy of characteristic x‐rays, edge‐jump, fluorescence yield, transition probability, mass absorption coefficient, backscatter coefficient, mean ionisation potential and atomic weight.