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Evaluation of the use of Gaussian ϕ(ρz) curves in quantitative electron probe microanalysis: A new optimization
Author(s) -
Bastin G. F.,
Van Loo F. J. J.,
Heijligers H. J. M.
Publication year - 1984
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300130211
Subject(s) - gaussian , microanalysis , histogram , electron probe microanalysis , electron , computer program , computational physics , analytical chemistry (journal) , optics , computer science , statistical physics , physics , chemistry , image (mathematics) , nuclear physics , artificial intelligence , scanning electron microscope , quantum mechanics , chromatography , organic chemistry , operating system
A computer program based on the use of Gaussian expressions for the x‐ray distribution with depth [ϕ(ρz)curves] was tested on its usefulness for quantitative electron probe microanalysis. As the good results originally claimed for a similar program could not be reproduced initially, it was subjected to a detailed analysis. As a result, some modifications in the approach are proposed. Apart from increasing the speed of calculation considerably, the modified expressions provide a better insight into the delicate balance which has to exit between the relevant quantities involved. After a new optimization process the modified program was tested on about 450 published microanalyses. The results show that the ϕ(ρz) approach is indeed very promising as a narrow histogram with an r. m. s. value of 5. 4% could be produced. Finally, some suggestions are made for future improvements.
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