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Trace element analysis of silicates by means of energy‐dispersive x‐ray spectrometry
Author(s) -
Johnson Robert G.
Publication year - 1984
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300130206
Subject(s) - calibration , analytical chemistry (journal) , analyte , matrix (chemical analysis) , trace (psycholinguistics) , mass spectrometry , silicate , materials science , chemistry , physics , chromatography , linguistics , philosophy , organic chemistry , quantum mechanics
Three methods for the energy‐dispersive x‐ray spectrometric analysis of trace elements in silicate rock samples were compared. The comparisons were based on three new USGS reference samples, DNC‐1, W‐2, and BIR‐1, and two established reference samples, G‐1 and W‐1. A loose powder sample preparation was used in the analysis of selected trace elements, including Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb and Ba. For one method, the ratio of analyte line intensity to either Compton or Compton and Rayleigh scatter intensity for a series of standards was used to construct calibration graphs. The other two methods involved fundamental parameter calculations which required a knowledge of the total sample compositions in order to perform the necessary matrix corrections. The results showed good accuracy for all three methods, but those obtained from the ratio–calibration graph method were slightly better than those from the other two methods.