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Measuring the dead time of an x‐ray spectrometer by means of the first‐ and second‐order reflections method
Author(s) -
Bonetto R. D.,
Riveros J. A.
Publication year - 1984
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300130109
Subject(s) - dead time , spectrometer , optics , detector , physics , photon , x ray , order (exchange) , photon counting , finance , quantum mechanics , economics
The dead time of a Philips PW 1410 x‐ray fluorescence spectrometer with a photon detector has been calculated employing intensities of first‐ and second‐order reflections. The spread of the values obtained can be considered very satisfactory in the light of the experimental difficulties inherent in this method.