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Proton and photon‐induced x‐ray fluorescence intensity from a monolayer sample of complex chemical and granular composition
Author(s) -
Volkov V. F.,
Krasnopolskaya N. N.
Publication year - 1984
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300130108
Subject(s) - monolayer , excitation , intensity (physics) , proton , absorption (acoustics) , fluorescence , analytical chemistry (journal) , x ray fluorescence , molecular physics , photon , x ray , distribution (mathematics) , materials science , chemistry , atomic physics , physics , optics , nanotechnology , nuclear physics , chromatography , mathematics , mathematical analysis , quantum mechanics
A probability method is used to describe the processes of characteristic x‐ray fluorescence excitation and absorption in a heterogeneous monolayer of particles. Based on this the analytical dependence of the characteristic x‐ray peak intensity on the sizes and shape of particles, and the distribution of elements among the particles is inferred, for two kinds of spectrum excitation. Theoretical evaluations for applying boundaries of the ‘thin’ homogeneous layer model to a heterogeneous monolayer are given. The elements to be determined in unknown compositions are S, Fe and Pb.