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K x‐ray production cross‐sections of Ag, Sn and Te by 32–80 MeV 32 S ions
Author(s) -
Bǎdicǎ T.,
Ciortea C.,
Petrovici A.,
Popescu I.,
Osipenko B. P.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120410
Subject(s) - ion , x ray , atomic physics , production (economics) , physics , materials science , nuclear physics , analytical chemistry (journal) , chemistry , chromatography , quantum mechanics , economics , macroeconomics
K x‐ray production cross‐sections of Ag, Sn and Te by 32‐80 MeV 32 S ions have been measured. The dependence of target K x‐ray yields on the target thickness was found to be negligible in the S (64 MeV) + Ag collision system. The experimental data are compared with some theoretical predictions.