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The direct addition of Fe‐55 into the sample for low Z elemental analysis by x‐ray emission spectroscopy
Author(s) -
Labrecque J. J.,
de Benzo Z. A.,
Rosales P. A.,
Preiss I. L.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120406
Subject(s) - excited state , relative standard deviation , x ray fluorescence , analytical chemistry (journal) , sample (material) , spectroscopy , materials science , x ray , x ray spectroscopy , sample preparation , fluorescence , chemistry , optics , physics , atomic physics , detection limit , environmental chemistry , chromatography , quantum mechanics
A new radioisotope excited x‐ray fluorescence (XRF) technique which employs source‐samples has been applied for the determination of low Z elements in geological materials. The source‐samples is prepared by directly inserting about 100 μCi of the radioisotope (Fe‐55) into about 10–20 mg of the sample in its holder and placing this directly on the face of the detector window. The precision (relative total standard deviation) of this technique for K 2 O%, CaO% and TiO 2 % is about 4% and is compared to conventional radioisotope excited XRF. Finally, the accuracy of this technique is shown by the analysis of five geological reference materials as well as compared to conventional radioisotope excited XRF.