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Automated matrix‐correction of line ratios in energy‐dispersive x‐ray fluorescence spectrum deconvolution
Author(s) -
Van Dyck P.,
Van Grieken R.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120306
Subject(s) - deconvolution , matrix (chemical analysis) , line (geometry) , energy (signal processing) , optics , analytical chemistry (journal) , spectrum (functional analysis) , computational physics , materials science , physics , chemistry , mathematics , statistics , geometry , chromatography , quantum mechanics , composite material
Most computer XRF‐spectrum deconvolution routines make use of fixed intensity ratios for the lines from one element. The magnitude of the error that fixed ratios imply has been quantitatively evaluated for samples with a varible thickness or matrix. A procedure for routinely adapting the line ratios according to the matrix effect in every sample (by making use of the matrix information present in the scatter peaks) enhances the accuracy of the spectrum evaluation.