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Properties of intrinsic germanium detectors at low engergies by escape peak spectroscopy
Author(s) -
Rosner B.,
Mingay D. W.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120208
Subject(s) - germanium , detector , resolution (logic) , semiconductor detector , photon , spectroscopy , physics , optics , spectral line , atomic physics , silicon , optoelectronics , quantum mechanics , astronomy , artificial intelligence , computer science
The study of the energy resolution and linearity of germanium, x‐ray detectors at very low energies is difficult due to the degradation of the spectral line shapes resulting from incomplete charge collection in the detectors's surface dead layer. The use of low‐energy, K escapes peaks obviates this difficulty as they are absorbed at depths characteristic of their full‐energy parent photons. Measurements have been performed using particle‐induced x‐ray emission analysis of targets having characteristic K and L x‐ray energies just above the Ge K‐edge. The escape peaks retain pure Gaussian shapes down to the noise level of the detector and open up the possibility of a selective field of high‐resolution escape‐peak spectroscopy.