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Determination of brass composition and plating thickness on brass‐plated wire and cord by x‐ray fluorescence spectrometry
Author(s) -
Ponchon J. L.,
Bourrain P.,
Palsky A.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120207
Subject(s) - brass , atomic absorption spectroscopy , analytical chemistry (journal) , repeatability , plating (geology) , mass spectrometry , metallurgy , polarography , materials science , chemistry , copper , chromatography , inorganic chemistry , physics , quantum mechanics , geophysics , geology
The control of brass composition and plating weight on brass‐plated steel wire and cord used as reinforcement in tyres is generally carried out by atomic absorption spectrometry, or by polarography. These methods require a mineralization of the sample and the analysis time is very long. On account of this, we have studied a direct analytical method on wires based on x‐ray fluorescence spectrometry. The mathematical method we use suppresses the influence of the cord construction and allows to calculate simultaneously the composition and thickness of the brass coating. The analytical performances, i.e. repeatability, accuracy and analysis time, are better than those prevailing with atomic absorption spectrometry or differential pulse polarography. Moreover, by dispensing with mineralization of the sample, XRFS is particularly well‐fitted for a routine control in production.