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X‐ray fluorescence analysis with a linear polarized beam after bragg reflection from a flat or a curved single crystal
Author(s) -
Wobrauschek P.,
Aiginger H.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120206
Subject(s) - monochromatic color , optics , bragg's law , crystal (programming language) , beam (structure) , scattering , reflection (computer programming) , materials science , total internal reflection , single crystal , radiation , excitation , amorphous solid , physics , diffraction , chemistry , crystallography , nuclear magnetic resonance , quantum mechanics , computer science , programming language
Improvements of the detection limits in photon induced x‐ray fluorescence analysis are obtained by the reduction of the radiation background using linear polarized x‐rays for excitation. A single crystal where Bragg reflection takes place at an angle 20 = 90° produces linear polarized and monochromatic x‐rays. The use of a single crystal instead of amorphous scattering materials increases the intensity of the polarized beam in some cases up to a factor 10 4 . The use of curved crystals instead of standard flat crystal geometries shows a further increase in the intensity of the exciting beam in the focus line. The crystals in use for both geometries are described. Samples can be investigated in either form, liquid or solid, no special preparation technique is required. Detection limits are given for some elements, absolute amounts of 150 picogram can be detected in some cases.