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A new source configuration for trace analysis of small samples by XRF
Author(s) -
Shenberg C.,
Boazi M.,
Rapaport M. S.
Publication year - 1983
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300120205
Subject(s) - point source , trace (psycholinguistics) , electromagnetic shielding , range (aeronautics) , sensitivity (control systems) , point (geometry) , signal (programming language) , radioactive source , analytical chemistry (journal) , materials science , optics , physics , geometry , chemistry , mathematics , computer science , engineering , chromatography , electronic engineering , philosophy , linguistics , detector , composite material , programming language
A new geometry for a radioactive source was developed for the XRF determination of trace elements in the range 0.1–50 μg in samples with diameters from 2–5 mm. The new set‐up was constructed with five 241 Am (45mCi each) point sources. The shielding and configuration of the source, as well as the choice of appropriate collimators in the optimal shapes and dimensions, were investigated in detail. The study was carried out to establish the conditions for obtaining maximum sensitivity. The count rates and signal‐to‐background ratios were compared with those obtained with an annular source and showed an improvement of a factor of ∼2 in the signal‐to‐background ratio and of a factor of 2–9 in the peak intensity for the elements studied (29≤ Z ≤ 47).