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Intercomparison of selected semi‐empirical and fundamental parameter interelement correction methods in x‐ray spectrometry
Author(s) -
Pella P. A.,
Sieber J. R.
Publication year - 1982
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300110407
Subject(s) - consistency (knowledge bases) , mass spectrometry , computer science , chemistry , chromatography , artificial intelligence
Fundamental parameter interelement correction methods such as NRLXF are finding increased use in quantitative x‐ray spectrometry. The purpose of this work was to compare the results obtained with each of the three options in NRLXRF, namely empirical, full, and theoretical, with a semiempirical model such as Rasberry‐Heinrich and an NBS fundamental parameter method to check for consistency. Well characterized alloys were chosen for making the intercomparison.