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Single pass major element x‐ray fluorescence analysis of silicate rock samples using a Philips 1212 spectrometer
Author(s) -
Parker R. J.
Publication year - 1982
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300110303
Subject(s) - spectrometer , silicate , x ray fluorescence , analytical chemistry (journal) , materials science , calibration , fluorescence , x ray , line (geometry) , mineralogy , chemistry , optics , physics , chromatography , organic chemistry , quantum mechanics , geometry , mathematics
A ‘single pass’ method of analysing silicate rocks for their major element composition has been developed using a Philips 1212 x‐ray fluorescence spectrometer. Samples need only be submitted once to the spectrometer and all ten major elements (SiO 2 , TiO 2 , Al 2 O 3 , Fe 2 O 3 T, MnO, MgO, CaO, Na 2 O, K 2 O and P 2 O 5 ) are determined using a Cr x‐ray tube and three analysing crystals, i.e. TIAP, PET and LiF 220 . The method has been evaluated in terms of the quality of the calibration lines for each element, the precision of replicated analyses and by the analysis of rock standards as unknown samples. The single pass method is rapid, facilitates on‐line data reduction and is capable of producing high quality analytical data.