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Automated qualitative wavelength‐dispersive x‐ray fluorescence analysis
Author(s) -
Platbrood G.,
Serbruyns M.,
Quitin J. M.
Publication year - 1982
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300110211
Subject(s) - fluorescence , spectrometer , x ray fluorescence , magnetic tape , spectral line , sample (material) , wavelength , line (geometry) , analytical chemistry (journal) , optics , computer program , materials science , x ray , physics , chemistry , computer science , acoustics , mathematics , geometry , chromatography , astronomy , tape recorder , thermodynamics , operating system
Abstract A SRSO1 Siemens x‐ray spectrometer equipped with a logical controller was controlled by a Tektronix 4051 computer to record step by step the x‐ray fluorescence intensities. Ten samples can be analysed after the recording of 2 spectra (LiF (110) and PET) for each sample on a magnetic tape. On a host computer, a program first reduces the x‐ray fluorescence spectra to find the peak parameters for each line and another program subsequently identifies the elements.