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An improved method of x‐ray fluorescence analysis of chrome containing refractories
Author(s) -
Banerjee Subrata,
Olsen Ben G.,
Hess Melvin K.
Publication year - 1982
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300110107
Subject(s) - sodium hexametaphosphate , x ray fluorescence , materials science , analytical chemistry (journal) , lithium (medication) , metallurgy , polishing , raw material , linear regression , sodium , nuclear chemistry , chemistry , fluorescence , mathematics , chromatography , physics , medicine , quantum mechanics , endocrinology , statistics , organic chemistry
An improved x‐ray fluorescence method has been developed for the analysis of chrome containing refractory materials (raw materials, in process and final products). It involves the fusion of the powdered samples with a mixture of sodium hexametaphosphate and lithium metaborate in the presence of lanthanum oxide into a glass disc followed by polishing of the disc before exposure to the x‐rays. Three British standards, two South African Standards and one NBS Standard were used for standardizing the method. SiO 2 , Fe 2 O 3 , Al 2 O 3 , CaO MgO and Cr 2 O 3 were used in the standardization because these compounds constitute the majority of the materials under analysis. Linear regression analysis of the data showed that all the lines were linear, the coefficient of determination being equal or close to 1.00 with a mean error of less than ±3.5%, excepting CaO which had a mean error of ±8.6% because of its low concentration and the larger variance in its standard value.