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Comparison of different methods for the matrix correction in X‐ray spectrometry
Author(s) -
Plesch R.
Publication year - 1981
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300100410
Subject(s) - matrix (chemical analysis) , ternary operation , x ray fluorescence , error analysis , yield (engineering) , mathematics , algorithm , chemistry , fluorescence , computer science , physics , thermodynamics , optics , chromatography , programming language
In order to empirically test five mathematical equations of matrix correction, the theoretical X‐ray intensities of the ternary system CrFeNi were used. The smallest analysis error was obtained from a complicated equation which was derived from theory. Simplification of this equation resulted in the equation developed by Rasberry and Heinrich which proved to be almost as effective and is thus to be preferred in practice because of its simpler structure. A further simplification, dispensing with a special correction for secondary fluorescence, led to a greatly increased analysis error. As expected, using the matrix element intensities instead of their concentrations resulted in larger analysis errors. Special consideration of the secondary fluorescence did not yield a better result. These results agree qualitatively well with the results obtained by Stankiewicz and Sanner which were obtained by means of the analysis of synthetic oxide standards.