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Si(Li) detector efficiency in standard X‐ray fluorescence geometries
Author(s) -
Szöghy I. M.,
Simon J.,
Kish L.
Publication year - 1981
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300100405
Subject(s) - scintillator , detector , fluorescence , yield (engineering) , photon , optics , materials science , analytical chemistry (journal) , energy (signal processing) , x ray detector , dead time , x ray fluorescence , physics , nuclear physics , chemistry , chromatography , quantum mechanics , metallurgy
Si(Li) detector efficieneres are measured up to 100 keV photon energy in typical X‐ray fluorescence geometries using 55 Fe, 109 Cd, 57 Co and 241 Am annular sources. The targets are common chemical compounds. The photopeak yield is normalized by the use of a bare CaF 2 (Eu) scintillator which is free of dead layer. The scintillator response is corrected for escape peak losses. The presented method permits the detection of long term changes in detector response. Discrepancies are found in published nominal detector thicknesses.