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Standardization of the peak area ratios obtained from the analysis of small glass fragments using energy‐dispersive X‐ray fluorescence spectrometers
Author(s) -
Howden C. R.,
Dudley R. J.,
Smalldon K. W.
Publication year - 1981
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300100303
Subject(s) - spectrometer , analytical chemistry (journal) , elemental analysis , x ray fluorescence , range (aeronautics) , fluorescence , spectral line , materials science , optics , chemistry , chromatography , physics , composite material , organic chemistry , astronomy
The spectral sensitivities of different energy‐dispersive X‐ray fluorescence spectrometers may vary to the extent that the same glass fragment produces noticeably different spectra. In this study a set of twelve glass standards has been prepared. These are polished glass discs which span a wide range of elemental levels, and have been prepared for the monitoring and measurement of relative instrument sensitivies. The polished discs were analysed several times in rapid succession on one instrument and the mean elemental peak area ratios obtained were designated as standard values for these samples. During subsequent routine analytical work on this and other instruments, the discs are regularly analysed and if any significant changes are found the new elemental ratios can be corrected to the standard values usually simply by multiplying by a constant (the relative sensitivity factor). The procedure is shown to be effective in the case of 14 fragments of glass weighing between 40 and 1160 μg which were analysed several months apart on two different instruments.