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Quantitative X‐ray diffraction analysis with qualitative control of calibration samples
Author(s) -
Knudsen Torben
Publication year - 1981
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300100203
Subject(s) - calibration , diffraction , x ray crystallography , quantitative analysis (chemistry) , phase (matter) , x ray , analytical chemistry (journal) , materials science , qualitative analysis , chemistry , optics , physics , chromatography , mathematics , statistics , qualitative research , social science , organic chemistry , sociology
Abstract Samples containing identical or very similar phases and differing in their contents of these can be used for calibration of a quantitative X‐ray diffraction analysis without knowing their actual mineralogical composition. The method requires that at least one major peak for each phase is well isolated and that the number of calibration samples is equal to or exceeds the number of phases.