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Runaways in X‐ray spectrometry
Author(s) -
Plesch R.
Publication year - 1981
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300100104
Subject(s) - mass spectrometry , standard deviation , gamma ray spectrometry , value (mathematics) , relative standard deviation , materials science , analytical chemistry (journal) , computer science , mathematics , statistics , chemistry , chromatography , radiochemistry , detection limit
A runaway criterion is proposed for X‐ray spectrometry which is based on the standard deviations obtained from the standard specimens with and without the analysis value to be tested. The standard deviations which are printed out on modern equipment are compared by means of the F test. The procedure is explained by means of examples. The consequences for the analysis of unknown specimens are discussed.