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Analysis of geologic materials using an automated x‐ray fluorescence system
Author(s) -
Schroeder Brian,
Thompson Geoffrey,
Sulanowska Margaret,
Ludden John N.
Publication year - 1980
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300090411
Subject(s) - calibration , fluorescence , trace (psycholinguistics) , x ray fluorescence , mineralogy , analytical chemistry (journal) , range (aeronautics) , absorption (acoustics) , mass spectrometry , geology , remote sensing , materials science , chemistry , optics , physics , environmental chemistry , chromatography , composite material , philosophy , linguistics , quantum mechanics
The use of an automated, software‐controlled X‐ray fluorescence spectrometer (Phillips AXS System)for analysis of geologic materials gives rapid, precise results. Fluorescence intensities are corrected for background and peak overlap and for mass absorption, and ratioed to a standard rock analyzed at frequent intervals. Major element determinations show precision and accuracy in the 0.5–3% range and are based on calibration with a wide variety of international reference rocks. Determinations for major elements are done on specially fused rock powders. Precision and accuracy for trace elements are generally in the 1–5% range. Calibration is also by use of reference rocks but the determinations are done directly on pressed rock powders.