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A method for isotope‐excited X‐ray fluorescence analysis of thick samples
Author(s) -
Datta S.,
Sadasivan S.
Publication year - 1980
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300090307
Subject(s) - excited state , calibration , matrix (chemical analysis) , line (geometry) , analytical chemistry (journal) , isotope , x ray fluorescence , sample (material) , calibration curve , range (aeronautics) , x ray , chemistry , fluorescence , materials science , atomic physics , physics , mathematics , optics , detection limit , statistics , chromatography , geometry , nuclear physics , composite material
A simple equation relating the intensity of characteristic X‐ray lines to their respective weight fractions has been obtained for a thick sample excited by an isotopic source. It follows from the equation that a single intense line in a standard sample suffices to generate calibration constants over a wide range of elements. Validity of this aproach has been demonstrated by the analysis of a standard soil sample using only the Fe Kα line for calibration. A procedure for correction of peak overlaps has been given using the Kβ/Kα ratios, modified by the matrix effects. The method is very useful for the analysis of soil samples and can be conveniently applied to other matrices.