Premium
Optimization of trace analysis by pixe: Angular dependence of the background continuum
Author(s) -
Renan M. J.
Publication year - 1980
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300090212
Subject(s) - bremsstrahlung , physics , charged particle , radiation , photon , electron , computational physics , atomic physics , particle (ecology) , nuclear physics , optics , ion , quantum mechanics , oceanography , geology
In charged particle induced X‐ray emission studies, the characteristic X‐rays are superimposed on a continuous background of electromagnetic radiation. This background is a significant source of uncertainty when charged particle induced X‐ray emission is used for analytical purposes. It is demonstrated that the angular distribution of secondary electron bremsstrahlung exhibits significant structure and may be exploited to improve the detection limits attainable with this method. For low‐energy continuum X‐rays, good agreement is obtained with predictions of the relativistic retardation model. Deviations at higher photon energies are attributed to Compton scattered γ‐rays. Finally, suggestions are made regarding optimum energy and angle selections for direct application of particle induced X‐ray emission as an analytical technique, especially when biological samples are investigated.