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X‐ray fluorescence analysis using intensive linear polarized monochromatic x‐rays after bragg reflection
Author(s) -
Wobrauschek P.,
Aiginger H.
Publication year - 1980
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300090206
Subject(s) - monochromatic color , polarizer , bragg's law , optics , wavelength , reflection (computer programming) , crystal (programming language) , synchrotron radiation , materials science , linear polarization , x ray , x ray fluorescence , physics , fluorescence , diffraction , laser , birefringence , computer science , programming language
To obtain intense linear polarized monochromatic X‐rays a single crystal where Bragg reflection occurs at an angle 2θ=90° is used. A number of suitable crystal materials is listed which fulfil the requirements of the Bragg equation for the wavelengths of standard X‐ray tubes and the angular condition. As the first result of a new construction a detection limit of 1 ng Ca was determined using a Cr anode and a Ta single crystal (002) plane as polarizer.