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A new system for on‐line x‐ray topography
Author(s) -
Komyak N. I.,
Lutsau V. G.,
Efanov V. P.,
Ivanov S. A.
Publication year - 1980
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300090111
Subject(s) - collimator , raster graphics , optics , line (geometry) , x ray , raster scan , radiation , silicon , line source , materials science , physics , computer science , computer graphics (images) , optoelectronics , geometry , mathematics
A new system for on‐line X‐ray topography is described, in which relative motions of separate assemblies are completely eliminated. The main elements of the system are a low‐power raster‐type X‐ray source with a transmission target and a multi‐capillary collimator. It takes about 2.5–3 min to produce a topograph of silicon single‐crystal (20 × 20 × 0.3mm) when the radiation source power is only 10W.