A new system for on‐line x‐ray topography | Zendy

Komyak N. I. | Zendy; Lutsau V. G. | Zendy; Efanov V. P. | Zendy; Ivanov S. A. | Zendy

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A new system for on‐line x‐ray topography

Author(s) -

Komyak N. I.,

Lutsau V. G.,

Efanov V. P.,

Ivanov S. A.

Publication year - 1980

Publication title -

x‐ray spectrometry

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.447

H-Index - 45

eISSN - 1097-4539

pISSN - 0049-8246

DOI - 10.1002/xrs.1300090111

Subject(s) - collimator , raster graphics , optics , line (geometry) , x ray , raster scan , radiation , silicon , line source , materials science , physics , computer science , computer graphics (images) , optoelectronics , geometry , mathematics

A new system for on‐line X‐ray topography is described, in which relative motions of separate assemblies are completely eliminated. The main elements of the system are a low‐power raster‐type X‐ray source with a transmission target and a multi‐capillary collimator. It takes about 2.5–3 min to produce a topograph of silicon single‐crystal (20 × 20 × 0.3mm) when the radiation source power is only 10W.

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