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An estimation of selected methods for the correction of interelement effects in X‐ray fluorescence analysis
Author(s) -
Stankiewicz W.,
Sanner G.
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080407
Subject(s) - residual , simple (philosophy) , variance (accounting) , simple linear regression , regression , regression analysis , mathematics , statistics , algorithm , philosophy , accounting , epistemology , business
Abstract The comparison of the efficiency of the selected interelement effect correction methods was the aim of this paper. The experiments were carried out on the synthetic oxide samples containing 0–40% PbO 2 , 20–60% ZnO, 0–40% Fe 2 O 3 and 0–30% SiO 2 . The existing strong interelement effects were evaluated by means of the Plesch criterion. In order to find the correction method giving the best results and at the same time being relatively simple for practical use the internal standard and several mathematical methods (de Jongh, Rasberry–Heinrich, Lucas‐Tooth–Pyne, and regression) were accurately investigated. The efficiency of the selected mathematical methods was characterized by the values of relative residual variance. None of the examined methods gives the best results for all elements simultaneously. The values of relative residual variance lie between 1% and 5%. The approximation by the Rasberry–Heinrich model gives the best average variance over all elements, but its practical use is very labour‐consuming. The simple form of the Lucas‐Tooth–Pyne and regression equations as well as the relatively simple calculations provide facilities for their application in laboratories not equipped with more sophisticated calculating systems. The internal standard method gives results which are comparable with those obtained by use of the mathematical methods tested.