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Influence of divergence of the primary radiation beam on the line intensity of the X‐ray fluorescence spectrum
Author(s) -
Pavlinsky G. V.,
Kitov B. I.
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080303
Subject(s) - radiation , divergence (linguistics) , intensity (physics) , optics , physics , beam (structure) , radiant intensity , fluorescence , line (geometry) , computational physics , mathematics , geometry , philosophy , linguistics
X‐ray fluorescence spectrum excitation theory is now well developed and uses the assumption that the primary X‐ray radiation beam is parallel. At the same time, in order to increase intensity it is necessary to keep the radiation source and fluorescence object as close as possible. In so doing the primary radiation divergence is found to be significant, and to ensure high accuracy of the intensity calculations it is necessary to evaluate the influence of this factor. Considerations are carried out for the cases of point, circular and line sources of primary radiation, selective effects being absent. The concept of the effective incidence angle is introduced which makes it possible to calculate X‐ray fluorescence intensities by formulae without correction for the primary radiation divergence. Values of the correction coefficients are given which correct for the dependence of the effective angle on chemical composition of the fluorescence material. The value of the effective incidence angle of primary radiation for a circular source is determined and compared with its theoretical value. Statistical treatment of the results shows insignificant differences between the experimental intensities and those calculated with correction for the primary radiation divergence when chemical composition variation of the material analysed is quite large.