Premium
Determination without standards of small amounts of metal compounds on microfilters by X‐ray fluorescence spectrometry
Author(s) -
Ohno Katsumi,
Fujiwara Jun,
Morimoto Ichiro
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080209
Subject(s) - x ray fluorescence , analytical chemistry (journal) , mass fraction , mass spectrometry , monochromatic color , materials science , substrate (aquarium) , fluorescence , chemistry , optics , chromatography , physics , oceanography , composite material , geology
The extracted minor phases in superalloys are analyzed by X‐ray fluorescence spectrometry without the use of standards. The calculation in the analysis is simplified by using a monochromatic X‐ray source and the fundamental parameter method. The extracts on the microfilter are approximated by thin film on the filter substrate, though the extracts were not homogeneous. This source permits a simple calculation using the thin film model to transform the measured X‐ray intensity to mass thickness and mass fraction, since the mass absorption coefficient for the primary beam is easily found in a commercially available table. A great advantage of this method is that the calculations are possible by using a small programmable calculator.