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Escape peak losses in Si(Li) detectors
Author(s) -
Sioshansi P.,
Lodhi A. S.
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080206
Subject(s) - range (aeronautics) , detector , materials science , atomic physics , physics , optics , composite material
Abstract Escape peak losses in Si(Li) detectors for X‐rays in the energy range 2.3–14.2 keV are measured and compared with calculations for normal incidence geometry. The importance of the results for multi‐elemental X‐ray emission analysis is pointed out.