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The PIXE facility at Eindhoven University of Technology
Author(s) -
van der Heide J. A.,
Kivits H. P. M.,
Beuzekom D. C.
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080205
Subject(s) - environmental science , engineering
A new facility for particle‐induced X‐ray emission analysis is presented. The performance of an on‐demand beam pulsing system is checked experimentally and results of some calculations are shown graphically.