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The Bragg reflection integral for pentaerythritol
Author(s) -
Hall Ray,
Lewis Margaret,
Leigh Bryan,
Evans Kenton
Publication year - 1979
Publication title -
x‐ray spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.447
H-Index - 45
eISSN - 1097-4539
pISSN - 0049-8246
DOI - 10.1002/xrs.1300080108
Subject(s) - pentaerythritol , optics , detector , bragg's law , analyser , reflection (computer programming) , diffraction , wavelength , materials science , physics , computer science , fire retardant , composite material , programming language
Pentaerythritol is, for a number of given reasons, notable among the relatively limited choice of materials suitable for the manufacture of Bragg X‐ray analysers for use in quantitative X‐ray spectrometry to relatively long wavelengths. In many, perhaps most, Bragg X‐ray optical systems the beam power throughput to the detector, and hence the system sensitivity, is directly proportional to the Bragg reflection integral. Absolute beam power spectrometry thus requires knowledge of the wavelength function of that quantity for the analyser used. In this paper the nature of that function, and its stability, is investigated for diffraction from the (002) planes of pentaerythritol.